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77
Veeco/DI Dimension 7000 Atomic Force Microscope (AFM)
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76
Veeco/DI Dimension 3100 Atomic Force Microscope (AFM)
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75
Union Hisomet-II Measuring Microscope
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74
Tencor P-17 stylus surface profiler
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73
Tencor P-16+ stylus surface profiler
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72
Tencor P-16 Step Height Measurement System
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71
Tencor P-15 Step Height Measurement System
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70
Tencor P-11 Step Height Measurement System
ÆǸÅÁß
69
Tencor P-10 Step Height Measurement System
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68
TENCOR FLX-2320
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67
Tencor / Prometrix RS 35 4PP
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66
SSM 530 HG-CV System for EPI resistivity measurement
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65
SSM 5130 HG-CV System for EPI resistivity measurement
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64
SSM 495 HG-CV System for EPI resistivity measurement
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63
SSM 2000 NANOSRP
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62
SSM 2000
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61
SSM 150 Auto Spreading Resistance Probe (ASRP)
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60
Semilab WT-2020( ¥ì-PCR) Carrier life time measurement
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59
Semilab WT-2000PVN( ¥ì-PCD) Carrier life time measurement
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58
SDI/SEMILAB FAaST 230 Non-contact CV/IV Measurement System
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57
Olympus MX61F microscope & AL110-LMB86 autoloader
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56
Olympus MX50A-F Microscope & AL100-LM6 Autoloader
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55
Nikon LV 150 Mcroscope
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54
Nikon Eclips L200 + NWL641 (Scope & Autoloader)
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53
Nanometrics Nanospec 6100UV Thin Film Thickness Measurement
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52
Nanometrics Nanospec 6100
ÆǸÅÁß
51
Nanometrics Nanospec 4150 Film Thickness Measurement
ÆǸÅÁß
50
Nanometrics Nanospec 2100 Thin Film Thickness measurement
ÆǸÅÁß
49
Nanometrics Nanospec 210 Thin Film Thickness measurement
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48
N&K OptiPrime - CD
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47
N&K 5300 CD Trench Depth & Thin film thickness Measurement
ÆǸÅÁß
46
N&K 5000 CD Trench Depth & Thin film thickness Measurement
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45
N&K 1700-RT Metrology system
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44
MCV 2500 HG-CV System for EPI resistivity measurement
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43
LEICA INS10
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42
KLA-Tencor Surfscan 6200 particle counter
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41
KLA-Tencor OSA 6100 Optical Defect Inspection
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40
KLA-Tencor OSA 6100 Optical Defect Inspection
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39
KLA-Tencor Candela CS20 Optical Defect Inspection
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38
KLA-Tencor Candela CS20 Optical Defect Inspection
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37
KLA-Tencor Candela CS10V Optical Defect Inspection
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36
KLA-Tencor Candela 8620 Optical Defect Inspection
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35
KLA-Tencor Candela 8620 Optical Defect Inspection
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34
KLA-Tencor Candela 8600 Optical Defect Inspection
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33
KLA-Tencor Candela 8600 Optical Defect Inspection
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32
KLA-Tencor Archer 10XT+(AIM+) Overlay Metrology
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31
KLA Tencor AIT XP+ (Fusion)
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30
Hitachi S-5500 In-lens FE SEM
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29
Bio-Rad QS-300 FT-IR (EPI.BPSG,C.O)
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28
BIO-RAD QS-1200 FT-IR
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[1]
[2]
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31208 TEL: 041-554-6920~1 FAX: 041-554-6922