|
장비정보
|
|
장비명
|
SSM 2000 |
| 모델명 |
SSM2000 |
제조사 |
SOLID STATE MEASRUEMENT INC. |
| 웨이퍼사이즈 |
Other
|
Vintage |
- |
| 매매상태 |
판매중
|
장비상태 |
수리중
|
| 제원 |
System Measurement Performance
- Spreading Resistance Dynamic Range : 1Ω to > 10Ω
- Reistivity : 10-⁴~ 4x10⁴Ωcm
- Concentration : E11 cm-3 ~ E21 cm-3
Computer Subsystem
- Operating System : Window XP
- Image Capture : Matrox Pulsar Frame Grabber / Video Controller
- Application S/W : NanoSRP'" software
Automated Features
•;; Probe conditioning /•;; Probe calibration /•;; Sample alignment /•;; Unattended operation
( (NanoSRP™ Bevel Edge Alignment Tool )
Probing Subsystem with multiple sample fixture
- Probe Spacing : Minimum 65 µ;;m (Standard)
- Probe Load : 10g (standard)
- Sample Mounts : Up to 6 samples
- Vision System : DIC / 5x, 10x, 20x, 50x objectives / Cohu 2100 series CCIR/RAL gray scale camera
- Stage Motion : 80 mm X/Y/Z-axis range (80mm/90mm/3mm)
- Vibration Damping Table
Accessories
- Mounted probes / Bevel Sample Mounts /Grinding jig / Heat sink for sample mounting /Mounting wax /0.05 or 0.1 um Diamond compound
- Measurement fixture: 6 position
- Conventional probe conditioning fixture :
QTA/P probe qualification samples / Probe Shaper Tool / Probe Cleaner Tool / Gorey-Schneider probe grinder
*. To be refurbished.
|
|
|
|
HOME > 장비 정보 