|
장비정보
|
|
장비명
|
KLA Tencor Candela CS920 |
| 모델명 |
CS 920 |
제조사 |
KLA TENCOR |
| 웨이퍼사이즈 |
6"
|
Vintage |
2014-12 |
| 매매상태 |
판매중
|
장비상태 |
AS-IS
|
| 제원 |
The Candela CS920 wafer inspection system is designed for power device manufacturers
to provide defect inspection and accurate process feedback.
This enables the industry to improve SiC substrate quality as well as the epitaxial growth yields
for both SiC epi and GaN-on-silicon processes.
The CS920 enables significantly enhanced yield and reduced time-to-root cause
by integrating surface defect detection and photoluminescence technology i one inspection platform.
- Optical Head with dual laser and multi-channel detectors.
- Wafer size : up to 200mm (Currently 150mm configured)
- Wafer thickness 350 - 1500 um
- Fully automated cassette-to-cassette wafer handling
- for measurement and analysis of front-surface and buried defect on SiC, GaN substrate and EPI
(Particle / Scratch / Stain / Carrot/ Stacking fault / Pit / Crack /...)
- 0.06 um defect sensitivity (PSL on Si)
- Photoluminescence
*. To be refurbished.
*. Installed in Clean-room.
|
|
|
|
HOME > 장비 정보 
.jpg)