|
장비정보
|
|
장비명
|
MCV 2500 HG-CV System for EPI resistivity measurement |
| 모델명 |
MCV2500 |
제조사 |
SDI/SEMILAB |
| 웨이퍼사이즈 |
12"
|
Vintage |
2010-10 |
| 매매상태 |
판매중
|
장비상태 |
수리중
|
| 제원 |
■ Capable up to 12" Wafer
■ SSM 52 Capacitance Measurement Unit
■ Motor control unit
■ Pneumatic control Unit
■ PC System
■ PROCAP software
■ Performance
- CV Meter Noise Test (Schottky Diode Test): 1 STD(%) <0.167%
- MOS Wafer Area Test : 1 STD(%) <0.1%
■ Capacitance: 0 ~ 2000pF(1MHz), 1 ~ 20,000pF(100KHz)
■ Conductance: 0 ~ 2000μS
■ DC Bias voltage: ± 250V
■ Ramp Rate: 0 ~ 50 V/s continuously variable
■ Drive Signal Frequency at 1Mhz voltage=15mV rms
■ Stress Voltage: ± 250V
■ CDA: 80~100psi, Nitrogen for sample purge:0~15psi
■ Ambient temperature: 18° - 25°C ± 2°C over 24 hour period |
|
|
|