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HOME >Tool's Information |
Tool's Specification.
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Tool Name
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SSM 2000 NANOSRP |
Model |
SSM 2000 Nano SRP |
Maker |
SOLID STATE MEASRUEMENT INC. |
Wafer Size |
Other
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Vintage |
2004- |
Sell Status |
SELL
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Tool's Condition |
Excellent
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Description |
System Measurement Performance
- Spreading Resistance Dynamic Range : 1§Ù to > 10§Ù
- Reistivity : 10-©ù~ 4x10©ù¥Øcm
- Concentration : E11 cm-3 ~ E21 cm-3
Computer Subsystem
- Operating System : Window XP
- Image Capture : Matrox Pulsar Frame Grabber / Video Controller
- Application S/W : NanoSRP'" software
Automated Features
•; Probe conditioning /•; Probe calibration /•; Sample alignment /•; Unattended operation
( (NanoSRP¢â Bevel Edge Alignment Tool )
Probing Subsystem with multiple sample fixture
- Probe Spacing : Minimum 65 µ;m (Standard)
- Probe Load : 10g (standard)
- Sample Mounts : Up to 6 samples
- Vision System : DIC / 5x, 10x, 20x, 50x objectives / Cohu 2100 series CCIR/RAL gray scale camera
- Stage Motion : 80 mm X/Y/Z-axis range (80mm/90mm/3mm)
- Vibration Damping Table
Accessories
- Mounted probes / Bevel Sample Mounts /Grinding jig / Heat sink for sample mounting /Mounting wax /0.05 or 0.1 um Diamond compound
- Measurement fixture: 6 position
- Conventional probe conditioning fixture :
QTA/P probe qualification samples / Probe Shaper Tool / Probe Cleaner Tool / Gorey-Schneider probe grinder
*. Fully refurbished.
*. Can demonstrate any time. |
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- Address:
3, Tongjeong 3-ro, Dongnam-gu, Cheonan-si, Chungcheongnam-do, Korea ,31208
- Phone:
82-41-554-6920~1 FAX: 82-41-554-6922
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