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No. | Tool Name | Sell Status | Photo
91 Veeco/DI Dimension 7000 Atomic Force Microscope (AFM) SELL
90 Veeco/DI Dimension 3100 Atomic Force Microscope (AFM) SELL
89 Tencor P-17 stylus surface profiler SELL
88 Tencor P-16+ stylus surface profiler SELL
87 Tencor P-16 Step Height Measurement System SELL
86 Tencor P-15 Step Height Measurement System SELL
85 Tencor P-11 Step Height Measurement System SELL
84 Tencor P-10 Step Height Measurement System SELL
83 TENCOR FLX-2320 SELL
82 Tencor / Prometrix RS35 (RS55) 4PP SELL
81 SSM 530 HG-CV System for EPI resistivity measurement SELL
80 SSM 5130 HG-CV System for EPI resistivity measurement SELL
79 SSM 495 HG-CV System for EPI resistivity measurement SELL
78 SSM 495 HG-CV System for EPI resistivity measurement SELL
77 SSM 2000 NANOSRP SELL
76 SSM 2000 SELL
75 SSM 150 Auto Spreading Resistance Probe (ASRP) SELL
74 Semilab WT-2020( ¥ì-PCR) Carrier life time measurement SELL
73 Semilab WT-2000PVN( ¥ì-PCD) Carrier life time measurement SELL
72 SDI/SEMILAB FAaST 230 Non-contact CV/IV Measurement System SELL
71 Olympus MX61F microscope & AL110-LMB86 autoloader SELL
70 Nikon LV 150 Mcroscope SELL
69 Nikon Eclips L200 + NWL641 (Scope & Autoloader) SELL
68 Nanometrics Nanospec 6100 SELL
67 Nanometrics Nanospec 2100 Thin Film Thickness measurement SELL
66 Nanometrics Nanospec 210 Thin Film Thickness measurement SELL
65 N&K OptiPrime - CD SELL
64 N&K 5300 CD Trench Depth & Thin film thickness Measurement SELL
63 N&K 5000 CD Trench Depth & Thin film thickness Measurement SELL
62 N&K 1700-RT Metrology system SELL
61 MCV 2500 HG-CV System for EPI resistivity measurement SELL
60 LEICA INS10 SELL
59 KLA-Tencor Surfscan 6200 particle counter SELL
58 KLA-Tencor Surfscan 6200 particle counter SELL
57 KLA-Tencor OSA 6100 Optical Defect Inspection SELL
56 KLA-Tencor OSA 6100 Optical Defect Inspection SELL
55 KLA-Tencor Candela CS20 Optical Defect Inspection SELL
54 KLA-Tencor Candela CS20 Optical Defect Inspection SELL
53 KLA-Tencor Candela CS10V Optical Defect Inspection SELL
52 KLA-Tencor Candela 8620 Optical Defect Inspection SELL
51 KLA-Tencor Candela 8620 Optical Defect Inspection SELL
50 KLA-Tencor Candela 8600 Optical Defect Inspection SELL
49 KLA-Tencor Candela 8600 Optical Defect Inspection SELL
48 KLA Tencor AIT XP+ (Fusion) SELL
47 Bio-Rad QS-300 FT-IR (EPI.BPSG,C.O) SELL
46 Asyst load port SELL
45 Asyst load port SELL
44 Asyst load port SELL
43 Asyst load port SELL
42 *(sold)Nanometrics Nanospec 4150 Film Thickness Measurement SELL
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  - Address: 3, Tongjeong 3-ro, Dongnam-gu, Cheonan-si, Chungcheongnam-do, Korea ,31208
  - Phone: 82-41-554-6920~1 FAX: 82-41-554-6922