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HOME >设备信息 |
设备信息
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设备名称
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N&K 1700 Trench Depth & Thin film thickness Measurement |
型号 |
N&K 1700 |
制造商 |
N&K |
晶元尺寸 |
6"
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Vintage |
- |
销售状态 |
销售中
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设备状态 |
Operational
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数据 |
*. Film Thickness and Trench profile measurement.
*. Manual load Metrology system.
*. Wafer: 4", 6", 8".
*. Spotsize: 50um.
*. Simultaneously determine thickness, n and k in the spectral range of 190-1000nm, trench profile and provide non-destructive, real time, high throughput measurements directly on the device.
*. Manual & Install software.
*. Pattern recognition software.
*. Installed in Clean-room. |
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- 总公司:
3, Tongjeong 3-ro, Dongnam-gu, Cheonan-si, Chungcheongnam-do, Korea ,31208
- 电话:
82-41-554-6920~1 传真: 82-41-554-6922
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