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 HOME >设备信息 |
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设备信息
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设备名称
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Tencor Viper 2410 Macro Defect Inspection |
| 型号 |
VIPER 2410 |
制造商 |
KLA TENCOR |
| 晶元尺寸 |
8"
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Vintage |
2000-12 |
| 销售状态 |
销售中
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设备状态 |
Operational
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| 数据 |
KLA-Tencor's 2401 Automated Macro Defect Inspection System
- Replacing the manual bright light macro defect inspection performed by operators.
- Automated detection, classification and reporting of all yield- critical macro after-develop inspection defect types,
including hotspots, scratches, large particles, extra and missing resist, unexposed fields, striations, developer spots and splashback.
- With sensitivity superior to that of operators, the 2401 Automated Macro Defect Inspection System detects defects reliably and repeatably, allowing disposition decisions to be made quickly and accurately, dramatically reducing scrap and preventing further investment in low-yielding wafers. |
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- 总公司:
3, Tongjeong 3-ro, Dongnam-gu, Cheonan-si, Chungcheongnam-do, Korea ,31208
- 电话:
82-41-554-6920~1 传真: 82-41-554-6922
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