Home
Equipments
Parts
About Us
Metrology
Step Height Measurement
Film Thickness Measurement
Microscope
Resistivity Measurement
Wafer Inspection
SEM
Others
Mask Inspection
Overlay
Automic Force Microscope
Flatness
Defect inspection
Film Stress Measurement
Auto loader
Process Tools
Furnace
EPI
Others
ASM
Etcher
Others
Dry & Rinser
Gas Monitor
Wafer Mark
Others
Auto Loader
Process Eq' Parts
AMAT EPI Reactor Parts
LPE Reactor Parts
Thermco Horizontal Furnace Parts
Others
ASM EPI Parts
Metrology Parts
KLA Tencor Parts
Bio-Rad/Accent Parts
Solid State Measurement Parts
Rudolph Parts
Nanometrics Parts
N&K Parts
Others
ADE
About Us
Business Area
Our Facilities
Contact Us
Full List
Metrology
Step Height Measurement
Film Thickness Measurement
Microscope
Resistivity Measurement
Wafer Inspection
SEM
Others
Mask Inspection
Overlay
Automic Force Microscope
Flatness
Defect inspection
Film Stress Measurement
Auto loader
Process Tools
Furnace
EPI
Others
ASM
Etcher
Others
Dry & Rinser
Gas Monitor
Wafer Mark
Others
Auto Loader
HOME >设备目录
制造商:
--All--
ADE
ALCATEL
APPLIED MATERIALS
ASM
Asyst
BIO-RAD
CANNON
CARL ZEISS
DAN
ELECTROGLAS
FISCHIONE
GSI/LUMONICS
HITACHI
HONDA
KARL SUSS
KLA TENCOR
KOGAKU
LAM
LEICA
LEITZ
LEO/KOBELCO
LPE
MARTEQ
MICROMANUPULATOR
N&K
N/A
NANOMETRICS
NATIONAL INSTRUMENTS
NICOLET
NIDEK
NIKON
OLYMPUS
PROMETRIX
RIGAKU
RIKEN
RUDOLPH
SDI/SEMILAB
SOLID STATE MEASRUEMENT INC.
SONIX
SUGAI
TEKTRONIX
THERMAWAVE
THERMCO
TOHO
UNION
VARIAN
VEECO
VERTEQ
ZELLWEGER
销售状态:
--All--
销售中
销售完毕
∴本页面
1
/ 2
No.
|
设备名称
|
销售状态
|
图片
88
Veeco/DI Dimension 7000 Atomic Force Microscope (AFM)
销售中
87
Veeco/DI Dimension 3100 Atomic Force Microscope (AFM)
销售中
86
Tencor P-17 stylus surface profiler
销售中
85
Tencor P-16+ stylus surface profiler
销售中
84
Tencor P-16 Step Height Measurement System
销售中
83
Tencor P-15 Step Height Measurement System
销售中
82
Tencor P-11 Step Height Measurement System
销售中
81
Tencor P-10 Step Height Measurement System
销售中
80
TENCOR FLX-2320
销售中
79
Tencor / Prometrix RS 35 4PP
销售中
78
SSM 530 HG-CV System for EPI resistivity measurement
销售中
77
SSM 5130 HG-CV System for EPI resistivity measurement
销售中
76
SSM 495 HG-CV System for EPI resistivity measurement
销售中
75
SSM 2000 NANOSRP
销售中
74
SSM 2000
销售中
73
SSM 150 Auto Spreading Resistance Probe (ASRP)
销售中
72
Semilab WT-2020( μ-PCR) Carrier life time measurement
销售中
71
Semilab WT-2000PVN( μ-PCD) Carrier life time measurement
销售中
70
SDI/SEMILAB FAaST 230 Non-contact CV/IV Measurement System
销售中
69
Olympus MX61F microscope & AL110-LMB86 autoloader
销售中
68
Nikon LV 150 Mcroscope
销售中
67
Nikon Eclips L200 + NWL641 (Scope & Autoloader)
销售中
66
Nanometrics Nanospec 6100UV Thin Film Thickness Measurement
销售中
65
Nanometrics Nanospec 6100
销售中
64
Nanometrics Nanospec 4150 Film Thickness Measurement
销售中
63
Nanometrics Nanospec 2100 Thin Film Thickness measurement
销售中
62
Nanometrics Nanospec 210 Thin Film Thickness measurement
销售中
61
N&K OptiPrime - CD
销售中
60
N&K 5300 CD Trench Depth & Thin film thickness Measurement
销售中
59
N&K 5000 CD Trench Depth & Thin film thickness Measurement
销售中
58
N&K 1700-RT Metrology system
销售中
57
MCV 2500 HG-CV System for EPI resistivity measurement
销售中
56
LEICA INS10
销售中
55
KLA-Tencor Surfscan 6200 particle counter
销售中
54
KLA-Tencor OSA 6100 Optical Defect Inspection
销售中
53
KLA-Tencor OSA 6100 Optical Defect Inspection
销售中
52
KLA-Tencor Candela CS20 Optical Defect Inspection
销售中
51
KLA-Tencor Candela CS20 Optical Defect Inspection
销售中
50
KLA-Tencor Candela CS10V Optical Defect Inspection
销售中
49
KLA-Tencor Candela 8620 Optical Defect Inspection
销售中
48
KLA-Tencor Candela 8620 Optical Defect Inspection
销售中
47
KLA-Tencor Candela 8600 Optical Defect Inspection
销售中
46
KLA-Tencor Candela 8600 Optical Defect Inspection
销售中
45
KLA Tencor AIT XP+ (Fusion)
销售中
44
Bio-Rad QS-300 FT-IR (EPI.BPSG,C.O)
销售中
43
BIO-RAD QS-1200 FT-IR
销售中
42
Asyst load port
销售中
41
Asyst load port
销售中
40
Asyst load port
销售中
39
Asyst load port
销售中
[1]
[2]
- 总公司:
3, Tongjeong 3-ro, Dongnam-gu, Cheonan-si, Chungcheongnam-do, Korea ,31208
- 电话:
82-41-554-6920~1 传真: 82-41-554-6922